Pacific Nanotechnology introduces Nano-DST advanced platform for AFM research applications

Pacific Nanotechnology, Inc. (PNI), having introduced the tabletop Nano-R™ AFM systems, now brings an advanced platform for research applications delivering dual scanner technology, the Nano-DST™.

The Nano-DST provides a radical new approach to the world of atomic force microscopy, AFM. Rather than having a single scanner restricted to scan area and resolution limitations, the Nano-DST incorporates two scanners.

The large area scanners come in three options to study areas up to 100, 200 or 400 microns in x and y. Using flexure design and light lever detection, these scanners exhibit particularly low bow and coupling.

The second scanner is a 5 micron tube design which is embedded in a dedicated sample puck. This may be used alone or when combined with the flexure scanner, the user is able to scan a large area to locate a specific feature and then zoom in to make a high resolution image. This is of benefit to those with the most challenging AFM imaging applications

The Nano-DST uses the latest controller technology. It is the first SPM controller to use two x,y,z scanning control cards backed with 24 bit electronics using industry standard National Instrument cards. These advanced components enable fast scanning where collection of a 300 line image is made in one second.

PNI co-founder and CTO, Dr Paul West, was excited about the new zoom capability to collect high resolution images. West says “PNI has provided a research tool that combines ease of use with top quality scanning performance. With the cost of ownership playing an important part in buying new equipment, the Nano-DST delivers in all departments.”

The Nano-DST system has all the basic scanning capabilities expected by users of AFM today. And PNI also offer a myriad of advanced scanning modes in an environment where users may also use the platform to develop their own techniques.