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Pacific Nanotechnology announces the Nano-R2™- a new generation AFM system

21 May 2006
Kerry Parker
CEO

Product news

Pacific Nanotechnology, Inc. (PNI) announces their new generation AFM system. It uses enhanced hardware and software to deliver a productive, easy-to-use system.

The Nano-R2™ has many advanced features including dual LCD monitors, advanced image acquisition software and a new 16/32 bit controller architecture. The Nano-R2™ is compatible with all of the optional features available for the popular and well-established Nano-R™ which offered a stage heater, environmental cell, and NanoRule+ software.

The Nano-R2™ is a multipurpose scanning probe microscope for capturing images and making measurements of structures on the nanometer scale. It has been optimized for both novice and expert users through having two versions of image acquisition software, X’pert™ and EZMode™.

Purchase of the Nano-R2™ provides the user with a complete package for AFM imaging. The master computer is backed with dual LCD monitors to visualize both the sample surface and probe while being able to interact with the control and analysis software. The system is completed with a control unit and theNano-R2™ stage unit.

Users may choose between the conventional Light Lever AFM-scanner and the advanced Crystal Force Microscope scanner. The LL-AFM is best suited to the visualization of nanostructures and making mode measurements while the CFM is ideal for routine topographic and metrology measurements.

Ease of probe replacement, alignment of probe and sample positioning with a high resolution color video optical microscope all go to make the system easy to learn to use, vital in the laboratory environment where being able to use many techniques as possible is the requirement for today’s materials characterization scientist.

Visit http://www.pacificnanotech.com/nano-r2.html and learn more about this latest development from PNI.

Tags

NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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Pacific Nanotechnology announces the Nano-R2™- a new generation AFM system