New X-Ray Diffraction Solution for Investigation of Diverse Samples

2 Dec 2016
Lois Manton-O'Byrne, PhD
Executive Editor

Product news

Bruker AXS introduces the D8 ADVANCE Plus™– a new member of the D8 ADVANCE family of X-Ray Diffraction (XRD) solutions. The D8 ADVANCE Plus is designed to investigate epitaxial and polycrystalline thin films, large and oddly shaped bulk specimens, as well as micro- to macro-amounts of powder samples under ambient and non-ambient conditions.

The new TRIO™ optic is the key component of the new D8 ADVANCE Plus, combining the three most commonly used X-ray diffraction geometries in one single optic:

(1) divergent beam for X-Ray Powder Diffraction (XRPD),

(2) high intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing incidence geometry, coating thickness determination and micro-diffraction, and

(3) pure Cu-Kα1 parallel beam for High-Resolution X- Ray Diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples.

The TRIO optic features motorized switching between the three geometries and fully software--controlled instrument alignment - SmartCalibTM .

The D8 ADVANCE Plus is the latest extension to the well-established D8 ADVANCE Multipurpose SolutionsTM family, joining the D8 ADVANCE EcoTM for full-sized goniometer powder diffraction and the D8 ADVANCE TwinTM for maximum performance on polycrystalline powder and layered samples. The D8 ADVANCE family with DAVINCI DesignTM guarantees unlimited extension of capabilities to match all analytical needs - now and in the future.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Polymeric MaterialsPolymeric materials are widely used in industries ranging from biomedical devices to packaging and electronics. Research into these materials focuses on their properties, including strength, flexibility, and degradation. Advances in polymer science have enabled the development of more sustainable and high-performance materials. Explore the best polymeric material products in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.Thin FilmsPowder Analysis
New X-Ray Diffraction Solution for Investigation of Diverse Samples