New Product Announcements at EMAG

12 Jul 2007

Product news

Hitachi High Technologies will be making a number of new product announcements at the EMAG Exhibition, University of Glasgow, 3-7 September 2007. Details will be available on a new high resolution 300kV field emission TEM which forms the start of Hitachi’s enhanced range of high-end TEMs. Additionally, new accessories for the popular TM-1000 tabletop microscope will be announced.

EMAG will provide the opportunity to see the S-3400N VP-SEM equipped with a wide range of analytical techniques (in association with Oxford Instruments), as well as the versatile TM-1000 tabletop microscope. The desktop SEM technology of the TM-1000 offers 10x improvement in resolution and magnification range as well as 100x improvement in depth of field compared to conventional optical microscopes. This, combined with the fact that no special specimen preparation is needed, makes the TM-1000 suitable for use on a wide variety of materials, especially for applications where optical microscopes reach their performance limits. The TM-1000 has also generated great interest among existing EM labs wishing to free-up more time on their high-end SEMs by utilizing the cost-effective TM-1000 for routine microscopy.

Microscopy and analysis experts from Hitachi will also be making presentations at the technical sessions and will be on hand for detailed technical discussions on new and current products throughout Hitachi’s growing TEM, SEM and STEM range of instruments.

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Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
New Product Announcements at EMAG