New NanoWizard®3 NanoOptics AFM System

4 Oct 2011
Roger Wayman
Administrator / Office Personnel

Product news

JPK Instruments continues to expand its range of research systems with the introduction of the NanoWizard®3 NanoOptics AFM system.

The NanoWizard NanoOptics head comes with good physical and optical access to the sample from top and bottom as well as from front and side, even when the head and condenser are in place. Additionally, it has an integrated port for fiber SNOM applications.

The new system can be used for a broad range of applications from nanoscale optical imaging by aperture and scattering-type SNOM to experiments involving interactions of light with the sample such as absorption, excitation, nonlinear effects and quenching. These include aperture fiber SNOM experiments where an integrated fiber SNOM port in the NanoOptics head and the tuning fork module allows hassle-free integration of techniques.

The NanoWizard®3 NanoOptics AFM can be used in a large number of configurations. The AFM system can be used for many more applications. It is also possible to interface and run different heads such as the ForceRobot®300 and the CellHesion®200 or to use the TopViewOptics™.

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NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
New NanoWizard®3 NanoOptics AFM System