New Long-Life, Low Noise Microchannel Plates

21 Feb 2012
Roger Wayman
Administrator / Office Personnel

Product news

PHOTONIS USA has announced the addition of a new Long-Life, Low Noise (L3N) performance option, which is now available across its entire microchannel plate (MCP) line. The new L3N option offers up to a one hundred-fold reduction in background noise when compared to traditional MCPs. Any MCP made by PHOTONIS USA can now be ordered with this new low-noise performance option.

The new low noise option is ideal for applications where the background noise of the specific application is currently lower than the detector noise. Recent tests confirmed that, at 0.01 counts/second/cm2, the L3N MCP dark count level approaches the background level of cosmic rays. L3N MCPs had previously been developed by PHOTONIS as a custom product, and has been deployed in a number of space exploration missions, including the Chandler X-Ray Telescope. Other applications include low level imaging and high energy physics research.

The L3N option is also being made available on any currently manufactured product by PHOTONIS which contains MCPs, including items such as specialty Stripline MCPs, Advanced Performance Detectors and Time-of-Flight Detectors. The Long-Life, Low Noise performance option must be specified at time of order.

Links

Tags

UV-Visible SpectroscopyUltraviolet-visible (UV-Vis) spectrophotometers are used to measure the interaction of UV and visible light with a sample, including transmission, reflectance & absorbance. The two major instrument classes are single-beam or double-beam spectrophotometers. More specialized equipment includes colorimeters, spectroradiometers and refractometers. Portable and microvolume spectrophotometers are also available. For the modular spectroscopy lab, explore a range of light sources for combination with a spectrograph/spectrometer and optics. Find the best UV-Vis spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Dark Count Level
New Long-Life, Low Noise Microchannel Plates