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New Axio Lab.A1 Microscope for Material Sciences

ZEISS Research Microscopy Solutions
9 Oct 2010
Sarah Sarah
Marketing / Sales

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Carl Zeiss introduces the Axio Lab.A1 microscope for examinations in reflected light in the materials sciences. It's particularly intuitive operation makes this upright microscope suitable for routine lab applications in metallography, quality control and for inspection tasks in production lines. This permits microscopic examinations of metallographic specimens and samples made of polymers or other materials. The Axio Lab.A1 can be used to determine not only the structure and surface quality of specimens, but also cracks or impurities.

The benefit of this microscope for industrial applications is the 50 watt halogen illumination. This halogen bulb is excellently suited not only for brightfield reflected light but especially for darkfield and differential interference contrast in circularly polarized light (C-DIC) as well as Polarized light. These contrasting techniques require a large amount of light. The interference contrast in particular is unique in this class and offers additional information about the sample, e.g. tiny defects or scratches that are not visible in brightfield or darkfield applications. The 22 millimeter field of view offers the user optimal visibility of the sample.

All objective lenses in the standard magnification series are accommodated on a 5-position turret so that no change is necessary during work. The Axio Lab.A1 also includes a 4-position reflector turret and a large selection of binocular photo and ergonomic tubes. The ergonomic compact design and easy, intuitive operation are special benefits not only for daily routine, but also for training and education.

The microscope system can be used with traditional cameras, with all cameras in the AxioCam line, particularly with the attractively-priced AxioCam ERc 5s, and with AxioVision image processing software.

Photo: The Axio Lab.A1 microscope for materials microscopy is especially suitable for routine lab applications in metallography, quality control and for inspection tasks in the production line.

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Non-Destructive TechniquesNon-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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New Axio Lab.A1 Microscope for Material Sciences