New AFM Platform for Analytical Measurements

30 Nov 2011
Roger Wayman
Administrator / Office Personnel

Product news

Anasys Instruments has announced the release of a brand new, easy-to-use research and analysis tool at the Fall 2011 MRS meeting. The afm+ is a fully integrated AFM platform offering three important analytical capabilities.

Using Anasys' proprietary thermal probe technology for Nanoscale Thermal Analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample or to obtain a transition temperature map. It makes measurement of glass transition temperatures (Tg) and melting temperatures (Tm) a simple operation. This mode also includes Scanning Thermal Microscopy (SThM) which allows the user to map relative thermal conductivity and relative temperature differences across the sample.

Transition temperature microscopy (TTM™) is used to quantify and map thermal transitions in heterogeneous materials. Transition temperature microscopy (TTM) is a fully automated mode in which an array of nano-TA measurements is rapidly performed and each temperature ramp is automatically analyzed to determine the transition temperature.

Finally, the afm+ is fully upgradeable to perform nanoscale infrared spectroscopy for measuring and mapping chemical composition on the nanoscale. This technology enables point-and-click nanoscale IR spectroscopy that produces IR spectra that correlate to FTIR libraries. This makes chemical imaging on the nanoscale a reality. The upgrade options also include the ability to measure the mechanical properties of samples. Data may be collected using a contact resonance method to map stiffness variations simultaneously with the topography.

In summary, the afm+ is providing the basis for a multifunctional nanoscale measurement suite. The afm+ is fully upgradeable to the Anasys nanoIR system, a probe-based measurement tool that utilizes infrared spectroscopy to reveal chemical composition at the nanoscale. The nanoIR also provides high-resolution characterization of local topographic, mechanical, and thermal properties. Potential application areas span the realms of polymer science, materials science, and life science, including detailed studies of structure-property correlations.

Links

Tags

Thermal Analysis EquipmentThermal analysis equipment is used for measuring heat flow, weight loss, dimension changes or thermomechanical properties and is important for analyzing a material’s performance and stability. Thermal analysis equipment includes differential scanning calorimeters (DSC), thermogravimetric analyzers (TGA), thermomechanical analyzers (TMA), dilatometers, thermometers, vapor sorption analyzers, boiling and melting point apparatus. Thermal analyzers can reveal properties such as melting, crystallization and glass transitions or other processes such as oxidation, decomposition, volatilization, as well as coefficients of thermal expansion and modulus. Find the best thermal analysis equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Thermal ProbeHeterogeneous Materials
New AFM Platform for Analytical Measurements