MultiMode PicoForce Revolutionizes Force Spectroscopy

8 Feb 2006

Product news

Veeco Metrology Group (NASDAQ: VECO), announces the release of the Digital Instruments MultiMode™ PicoForce™ Scanning Probe Microscope (SPM) Control System for demanding biology and materials research. The PicoForce system, combined with powerful software developed specifically for force spectroscopy, enables accurate force measurements and manipulation of biological or material samples at the pico-Newton level, including inter- and intra-molecular forces, for applications ranging from drug discovery to basic molecular-scale research..

'Most force spectroscopy experiments demand precise, accurate control of tip-sample separation and low-noise detection of cantilever deflection,' explains Bob Tench, product manager at Veeco Metrology Group. 'The new PicoForce incorporates several innovations in nanotechnology that allow unprecedented control of these aspects, making this a particularly interesting product in the study of protein unfolding, antibody-antigen interactions, molecular motors, and nanoscale mechanical properties.'

The MultiMode PicoForce utilizes the world's best-selling atomic force microscope (AFM), a scanner with closed-loop control of the Z-axis that accurately controls tip-sample separation, and new software GUI developed specifically for force spectroscopy (see www.di.com/picoforce. It also includes an innovative handheld tool that features unparalleled sensitivity to tip-sample interaction force. Another cost-saving feature is the PicoForce system's modular design, which allows existing MultiMode AFM users to upgrade individual components rather than start over with entirely new equipment.

Veeco Instruments Inc. is a worldwide leader in process equipment and metrology tools for the optical telecommunications/wireless, data storage, semiconductor and research markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan, and Asia Pacific. Additional information on Veeco can be found at www.veeco.com

Tags

Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
MultiMode PicoForce Revolutionizes Force Spectroscopy