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Microtrac Retsch GmbH - A new technological leader in particle characterization

RETSCH Technology GmbH, Microtrac Europe GmbH and BEL Europe GmbH have merged to become Microtrac Retsch GmbH

12 Mar 2020
Sophie Ball
Publishing / Media

Industry news

This new constellation allows users of particle characterization in the EMEA region to access the broadest product portfolio worldwide from one single source. Under the brand name Microtrac MRB the company provides systems for particle characterization by laser diffraction, dynamic light scattering, dynamic & static image analysis, as well as gas adsorption measurement to determine the specific surface and pore size distributions.

RETSCH Technology has been part of the VERDER Group since its foundation in 1998 and has revolutionized the market for particle characterization with Dynamic Image Analysis by developing the dual camera technology implemented in the CAMSIZER series.

The manufacturing companies Microtrac Inc. (USA) and MicrotracBEL (Japan) were acquired by VERDER in July 2019. Thus, a new global player has formed under the roof of the VERDER Group who aims to become a technological leader in particle characterization.

Gerhard Raatz, Sales Director of Microtrac RETSCH, looks optimistically into the future: “By merging our companies we can now leverage our combined capabilities, along with our business and customer relationships and profit from synergetic effects. With our comprehensive product range, we strengthen our global position as an innovative and trustworthy partner for our customers.”

The headquarters of Microtrac Retsch GmbH are located in Haan near Duesseldorf/Germany, on the premises of the VERDER SCIENTIFIC Division. The companies RETSCH, Carbolite Gero, Eltra, ATM and Qness are also part of this Division.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Particle CharacterizationParticle characterization instruments are used to determine particle size distribution, shape, surface area, zeta potential, density and porosity of particles and materials. Multiple tecchniques are available for determining particle size, shape and count including dynamic light scattering (DLS), laser diffraction, electrozone (Coulter technique), imaging particle analysis and single particle optical sensing. Determine the density of your material with a gas pycnometer or examine its surface area and porosity with gas adsorption analyzers and mercury porosimeters. Find the best particle characterization instruments in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Dynamic Light ScatteringDynamic light scattering is used to measure the size distribution of particles in suspension by analyzing the way light scatters off them. It is commonly used in materials science, nanotechnology, and protein characterization. Browse our peer-reviewed product directory to find the best dynamic light scattering systems, compare products, check reviews, and get pricing directly from manufacturers.Gas AnalysisGas analysis is used to measure the composition of gases in various environments, such as industrial processes, air quality monitoring, and environmental studies. Techniques like gas chromatography and mass spectrometry are commonly used. Explore gas analysis tools in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

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Microtrac Retsch GmbH - A new technological leader in particle characterization