Malvern Panalytical’s new Aeris: a compact XRD system making a big impact

26 Feb 2021
Tom Casburn
Associate Editor

Product news

Malvern Panalytical, a leading analytical instruments and services supplier, launches a new version of its Aeris compact X-ray diffractometer (XRD). Aeris is a small-footprint system with a big heart, and even bigger ambitions. This new version contains capabilities previously only seen in much larger systems, powering exciting leaps forward in scientific progress. Building on the family of compact Aeris XRD systems which provide high quality data from polycrystalline materials at competitive speeds, the new Aeris model is designed for use in all environments. Specifically, grazing-incidence XRD (GIXRD) will enable the examination of thin films and coatings, while transmission measurements will provide more accurate data that are not affected by sample preparation artefacts.

The Aeris XRD is a compact system that provides high quality data from polycrystalline materials at competitive speeds. Its straightforward operational interface simplifies XRD measurements for the user. The performance of the Aeris is similar to floor standing systems. It does not require any external supplies and infrastructure and is highly cost effective. What’s more, the Aeris can be used in a regulated environment with OmniTrust software.

Even with expanding capability range, operators will still be able to switch easily between different applications, enabling them to concentrate on their research rather than on setting and aligning the system. With the new Aeris, researchers can obtain detailed, accurate data more easily and affordably, opening possibilities for smaller companies in the pharmaceutical and coatings industries, as well as educational institutions, to contribute to scientific research and process development.

Wilijan Vissers, Product Manager Aeris: “I’m very proud that we’re launching our new Aeris – a model that continually raises the bar for powder XRD. By providing the data quality of a floor-standing system in a compact instrument, the new Aeris will enable a wider range of our customers to carry out in-depth materials analysis and optimize their processes – helping push the scientific frontier even further forward.”

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Thin FilmsCompound IdentificationEnvironmental AnalysisEnvironmental analysis describes a variety of tests that determine the effect of chemicals, processes and particulates such as persistent organic pollutants (POPs) have on the environment.Crystallography2D Materials