Malvern Panalytical acquire X-ray diffraction product line

1 Nov 2023
Jemima Arnold
Editorial Assistant

Product news

Malvern Panalytical, a leading analytical instrumentation supplier, recently announced it has acquired the product line for six X-ray diffraction (XRD) products from Freiberg Instruments GmbH. The acquisition supports Malvern Panalytical's growth strategy, advancing its portfolio of market-leading analytical solutions for the semiconductor industry.

Semiconductor manufacturing increasingly relies on a variety of crystalline substrate materials, which are required to create thin wafers. As production processes become more advanced, and production volumes continue to grow, these wafers need to be produced quickly and efficiently, and precise crystal orientation and offcut angles are increasingly important. The acquired XRD systems allow rapid orientation of ingots and wafers, accelerating and simplifying the preparation of semiconductor substrates before epitaxy or lithography. This enhances yield, minimizes waste and reduces costs which supports our customers’ sustainability ambitions.

Lars Grieger, Business Development Manager of Semiconductor Metrology at Malvern Panalytical, said, “The addition of these specialized products to our analytical portfolio enables innovative crystal orientation control. When combined with Malvern Panalytical’s global presence and expertise, this provides a significant boost to the semiconductor wafer industry. This is a hugely exciting time for Malvern Panalytical, and we are looking forward to help realize the future of semiconductor metrology for our customers.”

Kay Dornich, CEO/Owner, Freiberg Instruments GmbH, added, “Our XRD solutions, with their ultra-fast Omega Scan technology, have consistently demonstrated their value to semiconductor manufacturers. Their speed, robustness, and reliability make them an excellent addition to Malvern Panalytical's portfolio and I’m excited to see these unique technologies made available to customers across the globe. At Freiberg Instruments, we will continue to support our existing customers and maintain our offering of specialized solutions, including those for automated workflows, which complement Malvern Panalytical’s newly acquired X-ray diffraction instruments.”

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Malvern Panalytical acquire X-ray diffraction product line