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Latest Gemini technology for ultimate microscopic characterization of challenging samples

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Join us on Tuesday, December 15, to find out how to utilize Gemini technology for ultimate microscopic characterizations of challenging samples

3 Dec 2020
Edward Carter
Publishing / Media

Expert insights

Dr. Ben Tordoff, Head of Materials Science at ZEISS Research Microscopy Solutions

Across the globe, scientists are finding increasing applications for microscopic characterization using field emission scanning electron microscopes (FE-SEM), especially in line with current research trends within the various sectors such as nanotechnology, miniaturization of devices, life sciences, as well as in designing and discovery of novel materials.

In this SelectScience webinar, microscopy expert Dr. Ben Tordoff, Head of Materials Science at ZEISS Research Microscopy Solutions, will highlight how the industry-leading Gemini technology was pioneered, the latest ZEISS FE-SEM portfolio, and its benefits for ultimate microscopic characterizations of challenging samples.

Register here

Key learning objectives

  • Benefits of the advanced Gemini technology
  • The new ZEISS FE-SEM portfolio
  • Examples of challenging applications: e.g. low-kV imaging and chemical mapping, imaging of magnetic domains, electron channelling contrast imaging (ECCI), 3D STEM for high resolution tomography

Who should attend?

  • Managers of core facilities and microscopy centers, scientists or research professionals in materials science, semiconductor/electronics, life science in academia, government, and industry
  • Ph.D. students, talented young researchers who are interested in microscopic characterizations

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary for continuing education purposes.

This webinar will run on Tuesday, December 15, at:

  • 16:00 GMT
  • 17:00 CET
  • 08:00 PST
  • 11:00 EST

Register for this webinar here>>

SelectScience runs more than 10 webinars a month across various scientific topics, discover more of our webinars here>>

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Tags

Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

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