JPK Instruments launch the NanoWizard®3 NanoScience AFM

22 Mar 2011
bridget bridget
Laboratory Director

Product news

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continues to expand its family of high performance research systems with the announcement of the availability of the NanoWizard®3 NanoScience AFM system.

Building relationships with the SPM community and collaborating with users worldwide has enabled JPK to develop powerful and flexible systems. Designing with upgradeability in mind guarantees a safe investment for users and an international team of experienced scientists and developers takes care of their service and support.

The resulting NanoWizard®3 NanoScience system design provides the highest AFM performance in liquids and air, integrated with optical microscopy. It provides optimum imaging in air and liquid for single molecules, polymers and nanomaterials. The tip-scanning head equipped with a flexure scanner gives highest flexibility for a large variety of different samples. In particular, large sample size scanning is possible. The expanded flexibility and modularity of design coupled with the widest range of operation modes and accessories from electrochemistry to the tip-assisted optics module makes this the ideal platform for multiple users and applications.

The core of the new system family is HyperDrive™, a SuperResolution AFM imaging technique. With extremely low tip-sample interactions, samples are never damaged. It is available with the NanoWizard®3 AFM head and the new Vortis™ high bandwidth, low noise control electronics. The system is extremely stable to drift and has the ability to detect the smallest cantilever deflections enabling some of the most stunning images ever produced in a commercial system. This digital controller has been built with flexible operation for the user in mind. The NanoWizard®3 is the only AFM system on the market which is designed for optimal use in liquid and comes with a vapour barrier, encapsulated piezos and a variety of dedicated liquid cells for applications ranging from single molecule experiments to corrosion in an electrochemical environment.

As JPK’s CTO, Torsten Jähnke, says - “Everywhere where AFM and optics, AFM in liquid and high quality AFM are needed, JPK is the right partner. We do not do every AFM application but what we do, we do with passion and perfection.”

NanoWizard®3 is a truly state-of-the-art designed system providing the broadest possible range of experimental options to the user: from single molecule force measurements to nanoindentation experiments applying JPK’s unique ExperimentPlanner™ and RampDesigner™ control routines.

JPK develop, engineer and manufacture instrumentation in Germany to the world-recognized standards of German precision engineering, quality and functionality. For further details on the NanoWizard® and other products in the JPK family of nanoscale characterization systems, please visit the JPK web site.

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NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.