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JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F

JEOL USA
27 Jul 2011
bridget bridget
Laboratory Director

Product news

The JSM-7800F is an ultimate analytical tool that answers a wide variety of users' needs. With its new super hybrid objective lens, the microscope is capable of high resolution imaging as well as high speed, high precision elemental analysis.

Features of the JSM-7800F include:

・ Ultimate resolution

The super hybrid objective lens achieves resolutions of 0.8 nm (15 kV) and 1.2 nm (1 kV).

・ High speed, high precision elemental analysis

The microscope performs speedy sample analysis with the optimally focused electron probe at high current without compromising the analytical accuracy and the quality of elemental mapping.

・ High quality data acquired by stable electron probe

The long lasting in-lens thermal electron gun produces a stable probe, which allows for continuous acquisition of high quality data from imaging and from various analysis including EDS, WDS, EBSD, and CL.

・ Support of wide ranging samples

The super hybrid objective lens can image/analyze magnetic samples at high magnification. It also makes imaging of non conductive samples easy.

Specifications:

SEI resolution
0.8nm (accelerating voltage 15kV)

1.2nm (accelerating voltage 1kV)

In Analysis mode: 3.0nm (accelerating voltage 15kV, WD 10mm, probe current 5nm)

Magnification
25 to 1,000,000x

Image types
Secondary electron image, backscattered electron image

Accelerating voltage
0.01 to 30kV

Probe current
Maximum 200 nA

Electron gun
In-lens thermal electron gun

Objective lens
Super hybrid lens

Specimen stage
5 axis motorized stage

Specimen exchange chamber
Standard

Links

JEOL USACompany website

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NanotechnologyNanotechnology, or nanotech, is an engineering technique using molecular scale functional systems. Applications of nanotechnology include medicine and medical devices, electronics, air and water purification, food science and energy production.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F