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HORIBA Scientific Announces New Software for Its ICP-OES Spectrometers

NEO Software will facilitate method development, sample measurements and results management

18 Mar 2016
Alex Waite
Editorial Assistant

Product news

HORIBA Scientific, global leader in ICP-OES spectrometry systems, announces its newest software release for their ICP-OES spectrometers.

ICP Neo delivers powerful tools for samples measurement with a new HDD mode (our unique and patented High Dynamic Range Detection System) integrated for standard measurement, advanced quality control protocols and retrospective analysis with respect to the integrity of raw results to match with good laboratory practices requirements.

For improved ease of use, NEO displays all information on a single screen allowing plasma and safeties monitoring at the same time than method development and acquisition. All the information can be viewed at a glance.

“We’ve given the NEO interface one of the most user-friendly GUIs on the market, as well as user-friendly tools,” says Matthieu Chausseau, Applications Manager at HORIBA Scientific. “It offers a multiple user capability with individual passwords, logoff and logon without stopping the sequence, a contextual tool bar to adapt the content with the window selected, user defined window display on the screen, user defined maintenance warnings, and diagnostics with real-time information on instrument status with filter selection, slits positions, grating position and PMT selection, along with zero order and reference acquisition with graphic display.”

Method development features include a visual display of interference free lines using S3 wavelengths database, a unique wavelengths database developed especially for ICP-OES by HORIBA Scientific. This database gives information not only on wavelengths but also on detection limits and is the only one to give reliable relative intensities between emission lines.

Full automation of the analysis is possible with a Smart Rinse feature for automatic monitoring of rinse efficiency between 2 samples, automatic control of the quality with limits on correlation coefficient and recalculated concentrations, and the automated Quality Control procedures that are fully US EPA compliant with ICV, CCV, LCS, Interference check, Paired samples, Spikes, etc.

ICP Neo is available for all of HORIBA Scientific’s Ultima family ICP-OES spectrometers. It is compliant with the latest Microsoft® platform, as well as Windows® 7 and 8. CPU05 electronics are required for communication with ICP Neo. For all instruments not equipped with CPU05 electronics, a field upgrade is available.

In addition to the basic software training given during the upgrade, dedicated advanced software training will also be available in the application lab in Edison, NJ, or on-site.

During installation, a basic training will be performed by the service engineer who will have been trained in the application laboratory. You will be able to use the software and perform your samples analysis as soon as installation is completed.

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ULTIMA Expert ICP-OES

HORIBA Scientific

ULTIMA Expert is designed with a unique plasma torch that offers a radial viewing mode far superior to competitive systems, thanks to the measurement of the entire normal analytical zone. The vertical torch, the original sheath gas device and the wide injector make the ULTIMA Expert more tolerant to difficult matrices, and offer the benefits of robust operation with minimal maintenance. High resolution and excellent sensitivity allow elements with high, low and trace concentrations to be measured accurately. ULTIMA Expert delivers the highest resolution with less than 5 picometers for the UV range and less than 10 picometers for the visible range, all due to its unique optical design which integrates a high density holographic grating and one meter focal length optics. Thermally stabilized optics ensure excellent long-term stability of the measurements. Full wavelength coverage from 120 to 800nm satisfies all the requirements for elemental analysis, including far UV capability for halogen analysis. Powerful software, with unique comprehensive tools offers advanced user guidance from sample to results. Image Navigator software provides qualitative and semi-quantitative analysis of unknown samples based on full spectrum acquisition, S3-base and MASTER for facilitated method development, and an uncertainty calculation tool for calibration quality improvement. The Analyst software provides full instrument control and advanced features for method development, analysis and results management. The robustness of the ULTIMA Expert makes it ideal for demanding applications such as mining, salt production, wear metals in oil analysis, petrochemical, metallurgical and chemical manufacture. The ULTIMA Expert comes with accessories for multiple demanding applications to further enhance its automation and functionality. For more information, please go to: http://www.horiba.com/scientific/products/atomic-emission-spectroscopy/icp-oes-spectrometer/

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