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Hitachi SU3500 Premium VP-SEM with Real-Time 3-D Image Observation Now Available with a 4-Axis Motorized Stage

Hitachi High Technologies America, Inc.
9 Jan 2014
Emily Marquez-Vega
Publishing / Media

Product news

The Nanotechnology Systems of The Nanotechnology Systems Division of Hitachi High Technologies America, Inc. announced that its latest VP-SEM system, Model SU3500, is now available with a 4-axis motorized stage, in addition to the existing 5-axis motorized stage system. The new 4-axis version is targeted for smaller sample applications (max. 200 mm in diameter and 70 mm in height).

The 4-axis motorized stage system features the same innovative electron optics and signal detection systems as the 5-axis motorized stage system, providing unparalleled 3-D imaging and analytical performance.

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SU3500 Premium VP-SEM

Hitachi High Technologies America, Inc.

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory. • Unparalleled Image Quality - All new electron optics design with best-in-class image sharpness • Intuitive Operation - Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology • Ultra Variable-Pressure Detector -Image surface information at low vacuum and low accelerating voltages • Stereoscopic Image Function -Point and click for seamless, real-time "3D" image observation

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.SEMScanning Electron Microscopy (SEM) is a technique that uses a focused electron beam to scan a sample and create high-resolution images. It is widely used in materials science, nanotechnology, and biological research. Explore SEM systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

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