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Hitachi High-Tech strengthens analytical business to solve social issues with core technologies

Hitachi High-Tech Europe
3 Apr 2025

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Hitachi High-Tech is strengthening its analytical business by integrating Hitachi High-Tech Analytical Science Ltd. and Hitachi High-Tech Science Corporation

Hitachi High-Tech Corporation ("Hitachi High-Tech") is strengthening its analytical business through integrating and jointly operating its Hitachi High-Tech Analytical Science Ltd. ("Hitachi High-Tech Analytical Science") and Hitachi High-Tech Science Corporation ("Hitachi High-Tech Science") businesses. As of April 1, 2025, Hitachi High-Tech Science will become Hitachi High-Tech Analysis Corporation as part of this re-structure.

By integrating the core technologies of both companies, it will be better equipped to address the increasingly complex processes involved in developing, manufacturing, and inspecting materials that our customers encounter. Bringing together X-ray fluorescence (XRF), optical emission spectroscopy (OES), laser induced breakdown spectroscopy (LIBS), thermal analysis (TA), liquid chromatography and spectrophotometers from Hitachi High-Tech Analytical Science and Hitachi High-Tech Science will facilitate the development of new, innovative solutions.

Initiatives to create a safe and secure society, and reducing environmental impact are becoming increasingly important across a wide range of business fields including healthcare, semiconductors and electronic components, and batteries. The analytical division and beam technology division, which includes electron microscopes, are key to supporting Hitachi High-Tech Group's Core Technology Solutions business. The Core Technology Solutions division leverages its expertise in observation, measurement, and analysis to offer specialized solutions for measurement and inspection. These solutions support the R&D, manufacturing, and quality control processes, helping to address both customer and societal challenges.

Whilst manufacturing processes are becoming more complex, waste reduction, circular economy and preservation of raw materials are key to a more sustainable, global industry. Hitachi High-Tech Group will use the “Power of Knowledge” it possesses to know accurately and leveraging deep understandings the genuine issues of society and customers, and will contribute to create a sustainable society by solving these issues.

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Atomic Absorption / Emission SpectroscopyAtomic absorption spectroscopy (AAS) and atomic emission spectroscopy (AES) — also called optical emission spectroscopy (OES) — are used to detect the elemental constituents in samples. Both techniques involve the atomization of a sample. Atomic absorption spectrometers may use a flame or furnace to create an atomic vapor of the sample before irradiation with spectral light. Optical emission spectrometers may use a flame, inductively coupled plasma (ICP), microwave plasma (MP) or spark arcs to atomize and excite the sample. At higher excitation energies, electrons can be emitted instead of photons, which can be useful for samples that can’t be atomized and for surface analysis. Explore electron spectroscopy equipment such as Auger spectrometers and photoelectron spectrometers for surface elemental analysis of samples. Find the best atomic absorption, photoelectron and optical emission spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Thermal Analysis EquipmentThermal analysis equipment is used for measuring heat flow, weight loss, dimension changes or thermomechanical properties and is important for analyzing a material’s performance and stability. Thermal analysis equipment includes differential scanning calorimeters (DSC), thermogravimetric analyzers (TGA), thermomechanical analyzers (TMA), dilatometers, thermometers, vapor sorption analyzers, boiling and melting point apparatus. Thermal analyzers can reveal properties such as melting, crystallization and glass transitions or other processes such as oxidation, decomposition, volatilization, as well as coefficients of thermal expansion and modulus. Find the best thermal analysis equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Material Testing

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