Hitachi High-Tech Science Corporation Launches the FT150 Series Fluorescent X-Ray Coating Thickness Gauge

27 Jan 2015
Sarah Thomas
Associate Editor

Product news

Fast, easy, and safe plating thickness measurement for small electronic components

Hitachi High-Tech Science Corporation (Hitachi High-Tech Science, President: Toshiyuki Ikeda) announced the release of the FT150 series (FT150/ FT150h/ FT150L) of X-ray coating thickness gauges for measuring plating thickness and composition at micro spots of less than 100 micrometers in diameter.

Advances in mobile electronic devices such as smartphone and tablet PCs, as well as in automotive electronic components have resulted in the miniaturization of semiconductors, passive components, and electronic components. In order to secure performance and quality, as well as to reduce costs of these components, high accuracy and efficient measurement of plating thickness and composition at micro spots of less than 100 micrometers in diameter is required.

Equipped with a polycapillary* optics that focuses X-rays, the FT150 series can rapidly measure plating thickness at micro spots. The improved X-ray detection mechanism achieves a measurement speed twice that of the conventional instrument (FT9500X) to measure the thickness of Au/Pd/Ni/Cu (gold/palladium/nickel/copper) multi-layer plating used in printed circuit boards or connectors. The newly developed polycapillary of the FT150h allows it to measure the plating thickness of electrodes on extremely small passive components. As with our conventional instruments, a closed housing greatly minimizes the risk of X-ray leakage, ensuring the safety of operators. In addition, samples can be easily set via a newly designed wide door and large sample observation window. Furthermore, new operation software that improves operability with newly designed icons and a graphical user interface, and an automatic data recording function helps reduce operator workload. The FT150 series achieves rapid measurement with high accuracy, resulting in higher efficiency and reduced inspection costs.

Notes
* Polycapillary: An optical element that works like a convex lens to focus X-rays onto a micro spot and is composed of several thousands of glass capillary tubes.

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Hitachi High-Tech Science Corporation Launches the FT150 Series Fluorescent X-Ray Coating Thickness Gauge