High Throughput Serial Block Face Imaging with JEOL FE SEM and Gatan 3View®

JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of biological and materials samples at ultrahigh resolution using the JEOL JSM-7100F Field Emission Scanning Electron Microscope with an integrated Gatan 3View® Serial Block Face Imaging System.

3View, an automated sectioning and image capture system that is specially designed for FE SEM, turns an embedded sample into thousands of images overnight or tens of thousands over a few days. A revolution in 3D microscopy, 3View creates perfectly aligned image stacks of thousands of sequentially-imaged slices of the freshly cut, resin embedded block face sample. The in-situ ultra-microtome creates slices <15 to 200nm in thickness with a total traverse of 600mm. The 3View uses a Gatan specimen stage and backscatter detector.

The ultra-versatile JSM-7100F FE SEM is an easy-to-use analytical SEM that combines large beam currents with a small probe size at any accelerating voltage. When combined with the 3View, high-stability and high-resolution is maintained throughout the entire 3D volume.