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Handheld XRF for Geological Analysis and Research

Bruker AXS Inc.
26 Sept 2011
Roger Wayman
Administrator / Office Personnel

Product news

Bruker AXS have introduced the Tracer IV-GEO which provides high performance for handheld XRF. This analyzer includes a 30 mm2 XFLASH™ Silicon Drift Detector (SDD). This detector along with the close optical coupling of the analyzer provides about three times the count rate available from typical SDD based systems.

The calibration for the Tracer IV-GEO, GEO-QUANT™ Mobile, was developed with the geosciences research community to fill the need for a flexible, customizable field worthy handheld XRF analyzer with benchtop performance. The open software architecture allows the user to acquire and view live spectral data with complete control of the acquisition conditions. In addition the calibration software allows the user not only to modify factory calibrations but create, exchange and modify their own calibrations using SPECTRA EDX, which is the same software used on the Bruker S2 RANGER series. SPECTRA EDX enables users to use full FP methods, advanced influence coefficient approach or classical empirical calibrations. Analysis can then be run using a laptop, while operating the unit in benchtop mode or loaded on the Windows Mobile driven PDA for field work.

Based on the variable alpha FP approach the TRACER IV-GEO is factory equipped with the mobile version of BRUKER’s GEO-QUANT. GEO-QUANT™ Mobile allows measurement majors, minors and traces under ambient conditions as well as in the enhanced sensitivity vacuum mode. The TRACER IV-GEO is fully field capable and supports GPS integration via Bluetooth enabled GPS receivers.

In addition to the Tracer IV-GEO the Tracer IV-SD is also available with a 10 mm2 or 30 mm2 detector for general research projects. The software suite supplied with the instrument allows the user to build a complete calibration using a proprietary set of standards.

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Bruker AXS Inc.Company website

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X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Environmental Monitoring and TestingEnvironmental monitoring and testing uses handheld portable analyzers, kits, spectrometers or chromatography systems for air, water, soil, food and other sample testing. Useful features of analyzers such as BOD and COD include portability, easy calibration, automation and sensitivity.  Environmental test kits for pH, water, moisture, etc, should be accurate, sensitive, reliable, fast and easy to use.Software PlatformsSoftware platforms are useful for various stages of laboratory experiments from data collection to data storage and processing. For instance lab software is available for system control, data management, data analysis and qualification / validation.

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Handheld XRF for Geological Analysis and Research