Facilitate the Creation of High-Resolution, Panoramic Images

12 Nov 2010
Sarah Sarah
Marketing / Sales

Product news

Olympus releases the Multi-position Solution module for its cellSens Dimension software. The module works in tandem with the cellSens Dimension Multiple Image Alignment (MIA) tool to facilitate the simple creation of high-resolution, panoramic images capable of covering the complete microscope stage.

The Multi-position software puts the user in the best position possible to accurately and automatically investigate large or complicated samples without sacrificing magnification power or image quality.
The Multi-position Solution module is designed to make the study of large or complicated samples simple, flexible and precise. Typically, the acquisition of microscope images has been a trade off between a need to capture pictures at a high level of magnification and a desire to maintain the widest possible field of view.

The Olympus Multi-position system provides researchers with the best of both worlds by allowing multiple, high-resolution images to be systematically captured and then seamlessly stitched together to create incredibly detailed panoramas limited only by the size of the microscope stage. The system is fully automated and customisable, providing the capacity to study as many areas of interest per sample as desired, or even the entire stage when necessary. In this way, sequential time-lapse imaging across different areas of a specimen can significantly boost the statistical relevance of the data collected.

As well as being fully compliant with Olympus hardware, the software integrates seamlessly with a wide range of third party stages, including those manufactured by Oasis, Prior, LUDL and Märzhäuser.
In combination with other Solution modules available for the cellSens Dimension system, the Multi-position Solution module removes the restrictions imposed by traditional image capture from a single field of view, making it possible to perform multiple fluorophore, 3D, time-lapse enabled imaging over an entire microscope stage.

cellSens Dimension
The cellSens Dimension software package is designed to offer control and processing for microscope-based experimental systems, providing a broad range of advanced features, as well as specialised, optional Solution modules. Users can conduct a range of complex and highly sophisticated experiments, from extended focal imaging to multiple image alignment and multi-position imaging. Furthermore, live images can be transferred directly to the web using the Netcam Solution, enabling rapid discussion with colleagues, wherever they are in the world. With the ability to control a wide range of Olympus and non-Olympus hardware, cellSens Dimension allows advanced and precise time-lapse experiments to be conducted. The resulting time stacks can even be put through kinetic and threshold-based object analysis. Once data has been obtained, the unique report composer uses Microsoft Word templates to generate user-defined reports that retrieve images and data directly from the cellSens database.

Links

Tags

Integration ServicesIncorporate lab systems, software and equipment with integration services.Light MicroscopyLight microscopes or optical microscopes are used to visualize microscale objects under magnification, including cells, clinical specimens and materials. Lab equipment for light microscopy includes confocal microscopes, fluorescence microscopes, zoom and stereo microscopes. Microscope slides and imaging reagents are available for visualizing samples, as well as various microscope stages and incubators for large or temperature-sensitive samples. Find the best light microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Facilitate the Creation of High-Resolution, Panoramic Images