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Digital Surf releases Mountains 8 image & surface analysis software

Digital Surf

This release builds extensively on the Mountains® 7 platform introduced in 2013 and now supplied by most major manufacturers with their instruments

6 Oct 2019
Laura Sisman
Administrator / Office Personnel

Product news

It also sees the coming together of Mountains® (internationally renowned for profilometer and scanning electron microscope data analysis) and SPIPTM (widely recognized for scanning probe microscopy)1, thus setting a new standard for surface metrology and image analysis.

With Mountains® 8 come a huge increase of calculation speeds, new types of surface data, greater interactivity and over a hundred new features.

From instrument-dedicated software to data confluence for research laboratories

The new Mountains® 8 range offers 3 families of instrument-specific products:

  • MountainsMap® for profilometers including 2D and 3D contact and non-contact profilers.
  • MountainsSEM®, dedicated to scanning electron microscopes.
  • MountainsSPIP®, dedicated to SPM instruments (atomic force microscopes, scanning tunneling microscopes).

Research laboratories using multiple types of instruments are also served thanks to new MountainsLab® software, a superset product designed to ensure multiple-source data confluence.

Significantly increased calculation speeds

With image resolution continually increasing, modern metrology and microscopy equipment demands boosted processing power. Mountains® 8 lets users access most single operations in real time and batch analysis operations in a matter of seconds. Among the features made considerably faster in version 8: Filter (form, waviness and roughness separation), Remove Outliers, Retouch, Fill in non-measured points and Stereo Reconstruction of SEM images.

A greatly extended toolset
Mountains® 8 features a highly advanced range of tools for processing measured data and images.

  • Particle & pore analysis, used in the quality control of structured materials (metal alloys etc.) or the characterization of nano-structure assemblies, has been largely remodeled and improved.
  • Freeform surface data (shells) can be loaded, visualized and 3D-printed. This brings high-level insight of data produced by profilers with multiple scanning axes, X-ray tomography (such as for additive manufacturing).
  • Smart surface texture parameters tables now automatically guide the user through complex filtering options, avoiding common errors.

Additionally, Mountains® 8 improved usability means it's easier to learn how to use the software. Users can access sample data, tutorials and templates based on their own instrument technology. Documents themselves can be used as teaching tools, with new features for demonstrating methods to fellow colleagues or students.

“Mountains® 7 saw Digital Surf’s entry into the electron microscopy market with the promise of taking SEM images from the flat black-and-white world to 3D color” stated Christophe Mignot, CEO. “In the next step of the continued evolution of our platform, Mountains® 8 has much to bring, in particular to SPM users who, in their study of the infinitely small, hold the key to the scientific challenges of tomorrow such as clean energy storage or the eradication of cancer and genetic diseases.”

1 Digital Surf acquired the Danish company Image Metrology, specialized in scanning probe microscopy image analysis, in 2014.

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Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Atomic Force Microscopy / Scanning Tunneling MicroscopyAtomic force microscopes (AFM) and scanning tunneling microscopes (STM) are high-resolution forms of scanning probe microscope (SPM) used to generate topological information of a sample down to the atomic scale. Instruments can generate an image of the surface topology, manipulate objects and reveal information on localized properties such as Young’s modulus, conductivity, and magnetism. High-quality STM and AFM probes optimized for your application are available, as well as other SPM-based instruments such as scanning ion conductance microscopes (SICM) & near-field scanning optical microscopes (NSOM). Find the best AFM and STM equipment in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Digital MicroscopyDigital microscopy involves using digital cameras and sensors to capture high-resolution images of samples for analysis. It offers enhanced imaging capabilities compared to traditional optical microscopy and is widely used in biological and material science research. Explore digital microscopy systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.MicroscopyMicroscopy is a technique used to observe small objects in detail, from cells to materials, using light or electron microscopes. It enables researchers to examine structures with high resolution, aiding in fields such as biology, medicine, and materials science. With advanced microscopy techniques, scientists can gain insights into cellular processes, tissue structures, and material properties. Explore the best microscopy solutions in our peer-reviewed product directory, compare products, read customer reviews, and get pricing directly from manufacturers.Surface AnalysisAFMDigital ImagingDigital imaging is a technique that captures images of biological and chemical samples in high resolution, often using advanced cameras and sensors. This technology is crucial in microscopy, diagnostics, and quality control. Explore digital imaging systems in our peer-reviewed product directory; compare products, check reviews, and get pricing directly from manufacturers.

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