Database of Standards and CRM’s for XRF and OES

14 Nov 2011
Roger Wayman
Administrator / Office Personnel

Product news

A new on-line searchable database has been launched by FluXana (Analysco in the UK) that takes the work out of finding the best reference materials for your XRF and OES applications. FLUXearch takes only four simple steps to search over 12,000 Certified Reference Materials (CRM’s) and identify those best suited to your application. The database contains over 9000 commercially available CRM’s for metals and alloys and 3000 more for non-metallic samples such as minerals, oils, plastics, ROHS, slags, cements, glasses, refractories and ceramics.

The database can be searched either by sample type and the elements required or by the CRM reference number. Searching by elements can be made more specific by choosing a particular base and any additional elements that need to be determined. A table of suitable standards is then displayed, and a single mouse click displays the full specification of that standard. Having placed all the standards of interest in a “shopping cart”, another single click will automatically request a quote from FluXana for the chosen CRM’s, usually responded to in 24 hours.

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Atomic Absorption / Emission SpectroscopyAtomic absorption spectroscopy (AAS) and atomic emission spectroscopy (AES) — also called optical emission spectroscopy (OES) — are used to detect the elemental constituents in samples. Both techniques involve the atomization of a sample. Atomic absorption spectrometers may use a flame or furnace to create an atomic vapor of the sample before irradiation with spectral light. Optical emission spectrometers may use a flame, inductively coupled plasma (ICP), microwave plasma (MP) or spark arcs to atomize and excite the sample. At higher excitation energies, electrons can be emitted instead of photons, which can be useful for samples that can’t be atomized and for surface analysis. Explore electron spectroscopy equipment such as Auger spectrometers and photoelectron spectrometers for surface elemental analysis of samples. Find the best atomic absorption, photoelectron and optical emission spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Fluorescence SpectroscopyFluorometers and spectrofluorometers (also called fluorescence spectrometers) are used to measure the intensity and wavelength of fluorescent light emitted from a sample after excitation by illumination. Spectrofluorometers utilize monochromators to select the desired wavelengths, whereas filter fluorometers employ a set of filters. Spectrofluorometers for measuring steady-state fluorescence and lifetime fluorescence (or time-resolved fluorescence) are available, as well as fluorescence microscopes and microplate readers. Find the best fluorescence spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.
Database of Standards and CRM’s for XRF and OES