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CLUE: Spectroscopic Accessory for SEMs

HORIBA Scientific
15 Aug 2007

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The Optical Spectroscopy Division of HORIBA Jobin Yvon is proud to introduce the new Cathodoluminescence Universal Extension (CLUE) upgrade for Scanning Electron Microscopes (SEMs). CLUE provides high resolution spectral information with the spatial resolution of an electron probe. Full user control of software offers polychromatic and monochromatic Cathodoluminescence images, as well as advanced mapping.

CLUE is easily adjustable, with an optical design that allows users to work from the UV to IR wavelength ranges while maintaining optical quality. Options are available for FAST spectral acquisition when working in CCD mode or high resolution spectral acquisition when working with a PMT. CLUE integrates easily with HORIBA Jobin Yvon's MicroHR and iHR spectrometers, Synapse™ CCDs, and PMT detectors for complete Cathodoluminescence analysis.

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Infrared / IR SpectroscopyInfrared (IR) spectroscopy measures the interaction of infrared light with a sample, including transmission, reflectance & absorbance, facilitating the identification of analytes. Equipment used for quantitative analysis includes Fourier-transform infrared (FTIR) spectrometers, infrared cameras, FTIR gas analyzers, as well as attenuated total reflectance (ATR) accessories and pellet or film presses. Find the best IR spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.UV-Visible SpectroscopyUltraviolet-visible (UV-Vis) spectrophotometers are used to measure the interaction of UV and visible light with a sample, including transmission, reflectance & absorbance. The two major instrument classes are single-beam or double-beam spectrophotometers. More specialized equipment includes colorimeters, spectroradiometers and refractometers. Portable and microvolume spectrophotometers are also available. For the modular spectroscopy lab, explore a range of light sources for combination with a spectrograph/spectrometer and optics. Find the best UV-Vis spectroscopy products in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Electron MicroscopyElectron microscopes (EM) are used to create high-resolution images of samples at the nanoscale by means of an accelerated beam of electrons as a source of illumination. Types of electron microscope include scanning electron microscopes (SEM), transmission electron microscopes (TEM), scanning transmission electron microscopes (STEM) and cryo-electron microscopes. Focused ion beam (FIB) microscopes are useful for modifying or milling a sample surface with nanometer precision, as well as imaging. Find the best electron microscopes in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.

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CLUE: Spectroscopic Accessory for SEMs