Bruker AXS Announces MICROSTAR ULTRA II High Brightness X-ray Source with Novel ULTRA FOCUS™ Electron Optics

15 Nov 2007
Kerry Parker
CEO

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Bruker AXS Inc., a leading global developer and provider of life science, materials research and industrial X-ray analysis tools, today announced its new MICROSTAR ULTRA II, the newest version of the 2007 R&D Award winning MICROSTAR ULTRA ultra-bright X-ray source for structural biology.

Its innovative new ULTRA FOCUS™ electron optics (patent pending) give an enhancement in intensity equivalent to a doubling of the anode rotation frequency and thus produce an extremely high intensity X-ray beam, more than 30 times brighter than a conventional rotating-anode generator. The intensity of the MICROSTAR ULTRA II now surpasses many second-generation synchrotron beam lines. The introduction of the MICROSTAR ULTRA II will change the way protein crystallography is done as most routine de novo structures can now be routinely determined in the home laboratory with time consuming trips to the synchrotron reserved for high resolution data collections, only.

“Our mission is to provide increasingly brighter sources, but always with the exemplary reliability and low cost of ownership that our users have come to expect from the MICROSTAR family”, said Dr. Roger Durst, Chief Technology Officer for Bruker AXS, ”With the development of the novel ULTRA FOCUS™, we are fulfilling this promise.”

The Bruker AXS ultra-bright MICROSTAR ULTRA II™ X-ray source for structural biology allows the collection of quality data that were previously difficult or impossible to analyze in the home laboratory.

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X-ray CrystallographyX-ray crystallography is an analytical technique used to determine the arrangement of atoms in a crystal. Monochromatic x-rays are produced from a synchrotron or x-ray generator. An x-ray crystallography system uses a detector to measure the x-ray diffraction from the crystal. The information is used to generate a 3D image of the crystal.X-Ray Diffraction and SpectroscopyX-Ray diffraction & spectroscopy are used in material characterization to discern the structure and elemental composition of a sample. X-Ray diffractometers (XRD) are superior instruments in elucidating the dimensional atomic structure of crystalline materials, including powders, thin films and single crystals. For large unit cells or ordered macromolecules, consider small-angle X-ray scattering (SAXS). X-ray spectroscopic techniques include X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), both providing simple and accurate methods for determining the elemental composition of a material. Energy dispersive (EDXRF) and wavelength dispersive (WDXRF) XRF spectrometers are available, as well as handheld/portable devices. High-resolution, 3D microstructure characterization of materials can be achieved with X-ray microscopes combining sub-micron resolution imaging with 3D computed tomography. Find the best XRD and XRF spectrometers in our peer-reviewed product directory: compare products, check customer reviews and receive pricing direct from manufacturers.Protein CrystallographyProtein crystallization is the process of crystallizing purified proteins for 3D structure analysis by x-ray crystallography. The main methods of protein crystallization include sitting drop, hanging drop and microbatch. It is important to control parameters such as pH, temperature and concentration. Following crystallization, detectors and software are used for data collection and analysis.
Bruker AXS Announces MICROSTAR ULTRA II High Brightness X-ray Source with Novel ULTRA FOCUS™ Electron Optics