Bruker AXS Announces Microanalysis Webinar: Practical Spectrum Imaging—Rapid Collection for Routine Analysis

Bruker AXS today announced an advanced microanalysis webinar entitled "Practical Spectrum Imaging: Rapid Collection for Routine Analysis." The event will take place Thursday, September 6, 2007 at 2:00 pm, Eastern Daylight Time (1:00 pm, Central Daylight Time) and requires registration.

The ability to quickly and accurately map element distribution over a sample area has become essential to material analysts involved with QA/QC, forensics, art conservation, and other scientific disciplines. High-speed X-ray detectors, coupled with powerful Spectrum Imaging tools, now automatically extract composition information in minutes, making X-ray microanalysis techniques practical for even routine applications.

During this one-hour webinar, Bruker AXS will present new X-ray data collection and data mining
techniques for samples of all sizes—from small samples analyzed in an electron microscope to large samples analyzed with an X-ray fluorescence (XRF) instrument. Scientists will learn how these EDS and micro-XRF Spectrum Imaging tools can help them discern even subtle compositional differences, identify phases and find trace elements in their samples.

Bruker AXS hopes scientists with related interests can join the company for this interesting and informative webinar. There is no charge to attend. If they cannot attend, but would like to receive a copy of the presentation, they are asked to contact Karen Roscoe at Bruker AXS. You can receive an emailed copy of the presentation, along with other microanalysis resource materials, after the webinar.

If you do wish to attend, please?follow?these?steps to register for the online event
1. Follow the article webpage link.
2. Click "Enroll".
3. On the enrollment form, enter the information requested and then click "Submit".

Once their registration is approved, they will receive a confirmation email message with instructions on how to join the event. For assistance, scientists are asked to contact the author, Karen Roscoe, by email.