Aspectrics Has Been Awarded its Sixth US Patent for its EP-IR Technology

Aspectrics, Inc., the innovator of Encoded Photometric Infrared Spectroscopy (EP-IR) analyzers, has been awarded a sixth US patent for its EP-IR disk technology and associated optics. The new patent, number 6,995,840 “Method and Apparatus for Radiation Encoding and Analysis”, was issued on February 7, 2006.

Operating at an ultra fast scan rate of 100 scans/second, Aspectrics’ EP-IR analyzers measure multiple gas components in the ppb to ppm range simultaneously, allowing for real-time monitoring of processes. The innovative analyzers are capable of providing accurate and reliable results even under the most hostile industrial environmental conditions and they have received the Military 202G Method 204D certification for successfully passing the High Frequency Vibration Resistance Test.

EP-IR is well positioned to replace conventional Non-Dispersive Infrared (NDIR), Fourier Transform Infrared (FTIR) and Gas Chromatographic (GC) technologies currently used for process monitoring and environmental applications. EP-IR is faster than traditional FT-IR systems, provides more information than NDIR systems and does not require consumables like process based GC systems.

To-date, Aspectrics has been awarded one European and seven US patents, covering the core encoding technology. In addition, there are a number of other patents still pending and in the process of submission.

Jim Yano, VP of Marketing for Aspectrics, comments: “We are delighted to have received our sixth US patent. The development of a strong patent position will enable us to have proprietary control of the EP-IR technology, which is set to become an industry standard.”