Anasys Instruments expands range with Heated Tip-AFM imaging capability for Nano-TA systems

With the successful launch of the NanoTA accessory for SPM users, Anasys have introduced a great new imaging capability. Using the ability to control the heat at the end of the tip, users of the NanoTA accessory may now image surfaces to study the change in topography as the surface undergoes physical change, e.g. a glass transition, a re-crystallization or a melt.

The ability to perform high resolution AFM imaging at sub 20nm resolution now comes with variable temperature control making this a much more useful tool for the microscopist. It enables a clearer understanding between scanned images and changes in thermal properties. The new scanning technique is called Heated Tip AFM (HT-AFM).

The NanoTA accessory further provides the user with local thermal analysis measurements where the probe is “parked” on top of a feature and then heated. The deflection of the probe will then follow the behaviour of the sample. For example, it may show initial expansion and then should an event be detected such as a glass transition, the probe will appear to sink into the surface indicative of the free volume change at this temperature.

Speaking about this exciting new capability, Greg Meyers, Group Leader for AFM at Dow Chemical in Midland, Michigan, USA, and an HT-AFM pioneer had the following comments: “The Anasys breakthrough in probe design for HT-AFM removes key roadblocks to advancing scanning thermal microscopy of polymeric materials. The probes can be used for tapping mode AFM allowing the full benefits of phase imaging to find regions of interest. The nanoscale contact areas now confine local thermal measurements to where many significant morphologies occur in polymer blends, multilayers, and composites.”